ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,980, issued on May 27, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Inspection system, lithographic apparatus, and insp... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,208, issued on May 27, was assigned to GROHE AG (Hemer, Germany). "Body of a sanitary fitting having an anti-corrosion layer and a method f... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,837, issued on May 27, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Storage layers for wafer bonding" wa... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,310,771, issued on May 27, was assigned to CANON MEDICAL SYSTEMS Corp. (Tochigi, Japan). "X-ray diagnosis apparatus and image processing appara... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,874, issued on May 27, was assigned to SAS Institute Inc. (Cary, N.C.). "Topological order determination in causal graphs" was invented by ... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. D1,077,382, issued on May 27, was assigned to LG Electronics Inc. (Seoul, South Korea). "Nozzle for dishwasher" was invented by Sungkyung Kim (Seo... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,317,627, issued on May 27, was assigned to SONY SEMICONDUCTOR SOLUTIONS Corp. (Kanagawa, Japan). "Semiconductor apparatus and semiconductor app... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,661, issued on May 27, was assigned to ABBYY Development Inc. (Dover, Del.). "Natural language detection" was invented by Michael Zatsepin ... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,161, issued on May 27, was assigned to Chongqing BOE Optoelectronics Technology Co. Ltd. (Chongqing, China) and BOE Technology Group Co. Ltd... Read More
ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,566, issued on May 27, was assigned to Hitachi High-Tech Corp. (Tokyo). "Defect inspection device and defect inspection method" was invente... Read More